Secondary Electron Contrast in STEM Electron Beam-Induced Current (EBIC): a Path Towards Mapping Electronic Structure
نویسندگان
چکیده
منابع مشابه
Depletion region surface effects in electron beam induced current measurements.
Electron beam induced current (EBIC) is a powerful characterization technique which offers the high spatial resolution needed to study polycrystalline solar cells. Current models of EBIC assume that excitations in the p-n junction depletion region result in perfect charge collection efficiency. However we find that in CdTe and Si samples prepared by focused ion beam (FIB) milling, there is a re...
متن کاملKeywords : semiconductor , electron beam induced current , depletion region modulation
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Electron beam induced deposition can be applied as a direct write technique for the creation of 3 dimensional nano-scale structures. The technique does not require lift-off and mask based process steps and therefore has potential for application in rapid prototyping for nanotechnology, with a high degree of flexibility. The material quality and microstructure of the deposition however, is usual...
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Background: Lutein, a carotenoid compound, has previously been studied for its antioxidant and medicinal properties as well as the moderate protection it confers against gamma radiation. This study aimed at evaluating the effects of lutein against radiation-induced hematological and biochemical changes in mice.Methods: The optimized dose of the compound was orally administered for 15 days, and ...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2018
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927618009716