Secondary Electron Contrast in STEM Electron Beam-Induced Current (EBIC): a Path Towards Mapping Electronic Structure

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Depletion region surface effects in electron beam induced current measurements.

Electron beam induced current (EBIC) is a powerful characterization technique which offers the high spatial resolution needed to study polycrystalline solar cells. Current models of EBIC assume that excitations in the p-n junction depletion region result in perfect charge collection efficiency. However we find that in CdTe and Si samples prepared by focused ion beam (FIB) milling, there is a re...

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Keywords : semiconductor , electron beam induced current , depletion region modulation

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ژورنال

عنوان ژورنال: Microscopy and Microanalysis

سال: 2018

ISSN: 1431-9276,1435-8115

DOI: 10.1017/s1431927618009716